Wavelet analysis for surface defect detection in printed electronics

This project aims to develop a robust methodology for detecting surface defects in printed electronics using advanced wavelet analysis techniques. The study will focus on two primary objectives. First, we will obtain high-resolution images of printed electronics samples at various scales. These samples will include different concentrations of the same material as well as samples composed of different materials. This diversity will enable a comprehensive analysis of surface defects across a range of conditions. Second, the acquired images will undergo detailed analysis using wavelet analysis. This involves selecting appropriate wavelet functions and developing a precise methodology to identify and characterize surface defects. The goal is to enhance defect detection accuracy, providing a reliable quality control measure for printed electronics manufacturing.